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OverviewThis book contains extended and revised versions of the best papers presented at the 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, held in Daejeon, Korea, in October 2015. The 10 papers included in the book were carefully reviewed and selected from the 44 full papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about new challenges both at the physical and system-design levels, as well as in the test of these systems. Full Product DetailsAuthor: Youngsoo Shin , Chi Ying Tsui , Jae-Joon Kim , Kiyoung ChoiPublisher: Springer International Publishing AG Imprint: Springer International Publishing AG Edition: Softcover reprint of the original 1st ed. 2016 Volume: 483 Dimensions: Width: 15.50cm , Height: 1.30cm , Length: 23.50cm Weight: 3.693kg ISBN: 9783319834405ISBN 10: 3319834401 Pages: 223 Publication Date: 22 April 2018 Audience: Professional and scholarly , Professional & Vocational Format: Paperback Publisher's Status: Active Availability: Manufactured on demand  We will order this item for you from a manufactured on demand supplier. Table of ContentsReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |
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