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OverviewThis book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below, such as statistical process variations, environmental variations, and layout effects. It teaches them the state-of-the-art in Variation-Aware Design tools, which help the designer to analyze quickly the variation effects, identify the problems, and fix the problems. Furthermore, this book describes the algorithms and algorithm behavior/performance/limitations, which is of use to designers considering these tools, designers using these tools, CAD researchers, and CAD managers. Full Product DetailsAuthor: Trent McConaghy , Kristopher Breen , Jeffrey Dyck , Amit GuptaPublisher: Springer-Verlag New York Inc. Imprint: Springer-Verlag New York Inc. Edition: 2013 ed. Dimensions: Width: 15.50cm , Height: 1.20cm , Length: 23.50cm Weight: 4.321kg ISBN: 9781461422686ISBN 10: 146142268 Pages: 188 Publication Date: 28 September 2012 Audience: Professional and scholarly , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: Manufactured on demand  We will order this item for you from a manufactured on demand supplier. Table of ContentsIntroduction.- Fast PTV Verification and Design.- Pictoral Primer on Probablilities.- 3-Sigma Verification and Design.- High-Sigma Verification and Design.- Variation-Aware Design.- Conclusion.ReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |
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