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OverviewThis hugely successful and highly acclaimed text is designed to meet the needs of materials scientists at all levels. In this third edition readers get a fully updated and revised text, too. Fultz and Howe explain concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM, and all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises. Full Product DetailsAuthor: Brent Fultz , James HowePublisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG Imprint: Springer-Verlag Berlin and Heidelberg GmbH & Co. K Edition: 3rd ed. 2008. Corr. 2nd printing Dimensions: Width: 15.60cm , Height: 4.10cm , Length: 23.40cm Weight: 2.780kg ISBN: 9783540738855ISBN 10: 3540738851 Pages: 780 Publication Date: 11 October 2007 Audience: Professional and scholarly , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: In Print  This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of ContentsDiffraction and the X-Ray Powder Diffractometer.- The TEM and Its Optics.- Scattering.- Inelastic Electron Scattering and Spectroscopy.- Diffraction from Crystals.- Electron Diffraction and Crystallography.- Diffraction Contrast in TEM Images.- Diffraction Lineshapes.- Patterson Functions and Diffuse Scattering.- High-Resolution TEM Imaging.- High-Resolution STEM Imaging.- Dynamical Theory.ReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |
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