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OverviewElectron energy loss spectrometry is a key analytical technique used to analyse a variety of materials and chemicals including ceramics, metals, polymers, minerals, semiconductors, and magnetic materials. This book serves as a reference on EELS with the transmission electron microscope. Full Product DetailsAuthor: Channing C. AhnPublisher: Wiley-VCH Verlag GmbH Imprint: Wiley-VCH Verlag GmbH Edition: 2nd Revised edition Dimensions: Width: 18.00cm , Height: 2.80cm , Length: 24.60cm Weight: 1.030kg ISBN: 9783527405657ISBN 10: 3527405658 Pages: 472 Publication Date: 29 October 2004 Audience: Professional and scholarly , Professional & Vocational Format: Hardback Publisher's Status: Out of Print Availability: Awaiting stock  Table of ContentsReviews...will be an instant best-seller ni the energy loss community... (Ultramicroscopy, Vol. 104, 2005) Author InformationChanning C. Ahn earned his PhD in Physics at the University of Bristol, UK, in 1986. He is presently a Professor at the California Institute of Technology. Tab Content 6Author Website:Countries AvailableAll regions |
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