Trace-Based Post-Silicon Validation for VLSI Circuits
Author:   Xiao Liu ,  Qiang Xu
Publisher:   Springer International Publishing AG
Edition:   Softcover reprint of the original 1st ed. 2014
Volume:   252
ISBN:  

9783319375946


Pages:   108
Publication Date:   23 August 2016
Format:   Paperback
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

Our Price $290.37 Quantity:  
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Trace-Based Post-Silicon Validation for VLSI Circuits


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Author:   Xiao Liu ,  Qiang Xu
Publisher:   Springer International Publishing AG
Imprint:   Springer International Publishing AG
Edition:   Softcover reprint of the original 1st ed. 2014
Volume:   252
Dimensions:   Width: 15.50cm , Height: 0.70cm , Length: 23.50cm
Weight:   0.454kg
ISBN:  

9783319375946


ISBN 10:   3319375946
Pages:   108
Publication Date:   23 August 2016
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

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