Trace-Based Post-Silicon Validation for VLSI Circuits
Author:   Xiao Liu ,  Qiang Xu, (Ma (National Institute of Advanced Industrial Science and Technology (AIST) and Kobe University, Japan)
Publisher:   Springer International Publishing
ISBN:  

9781299857261


Pages:   118
Publication Date:   01 January 2014
Format:   Electronic book text
Availability:   In stock   Availability explained
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Trace-Based Post-Silicon Validation for VLSI Circuits


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Author:   Xiao Liu ,  Qiang Xu, (Ma (National Institute of Advanced Industrial Science and Technology (AIST) and Kobe University, Japan)
Publisher:   Springer International Publishing
Imprint:   Springer International Publishing
ISBN:  

9781299857261


ISBN 10:   1299857264
Pages:   118
Publication Date:   01 January 2014
Audience:   General/trade ,  General
Format:   Electronic book text
Publisher's Status:   Active
Availability:   In stock   Availability explained
We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately.

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