Overview

This is a single-source treatment of developments in TFT production from international specialists. It interweaves overlapping areas in multiple disciplines pertinent to transistor fabrication and explores the killer application of amorphous silicon transistors in active matrix liquid crystal displays. It evaluates the preparation of polycrystalline silicon TFTs for applications in cameras, video recorders, PDAs, and cell phones.

Full Product Details

Author:   Cherie R. Kagan (IBM, Yorktown Heights, New York, USA) ,  Paul Andry (IBM, Yorktown Heights, New York, USA)
Publisher:   Taylor & Francis Inc
Imprint:   CRC Press Inc
Dimensions:   Width: 15.60cm , Height: 2.90cm , Length: 23.40cm
Weight:   0.861kg
ISBN:  

9780824709594

ISBN 10:   0824709594
Pages:   544
Publication Date:   25 February 2003
Audience:   Professional and scholarly ,  Professional and scholarly ,  Professional & Vocational ,  Postgraduate, Research & Scholarly
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print  
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Author Information

Cherie R. Kagan is a Research Staff Member at the IBM T. J. Watson Research Center, Yorktown Heights, New York. The author or coauthor of more than 15 professional publications and holder of four patents with four pending, she is a member of the Materials Research Society, the American Chemical Society, and the American Physical Society. Dr. Kagan received the B.S.E. degree (1991) in materials science and engineering and the B.A. degree (1991) in mathematics from the University of Pennsylvania, Philadelphia, and the Ph.D. degree (1996) in electronic materials from the Massachusetts Institute of Technology, Cambridge. Paul Andry is Research Staff Member at the IBM T. J. Watson Research Center, Yorktown Heights, New York. The author or coauthor of more than 20 professional publications and the holder of two patents with eight pending, he is a member of the Materials Research Society and the Society for Information Display. Dr. Andry received the B.Sc. degree (1986) in physics from the University of Waterloo, Ontario, Canada, the M.Sc. degree (1990) in physics from the Universite de Sherbrooke, Quebec, Canada, and the Ph.D. degree (1997) in materials science from the University of Vermont, Burlington.

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