Overview

Mechanical stress affects the magnitude of base-emitter voltages of forward biased bipolar transistors. This phenomenon is called the piezojunction effect. The piezojunction effect is the main cause of inaccuracy and drift in integrated temperature sensors and bandgap voltage references. The aim of this text is twofold. Firstly, to describe techniques that can reduce the mechanical-stress-induced inaccuracy and long-term instability. Secondly, to show that the piezojunction effect can act upon various types of mechanical-sensor structures.

Full Product Details

Author:   Fabiano Fruett ,  Gerard C.M. Meijer
Publisher:   Springer-Verlag New York Inc.
Imprint:   Springer-Verlag New York Inc.
Edition:   2002 ed.
Volume:   682
Dimensions:   Width: 15.50cm , Height: 1.10cm , Length: 23.50cm
Weight:   0.940kg
ISBN:  

9781402070532

ISBN 10:   1402070535
Pages:   162
Publication Date:   31 May 2002
Audience:   College/higher education ,  Professional and scholarly ,  Undergraduate ,  Postgraduate, Research & Scholarly
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print  
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Table of Contents

Mechanical stress in integrated circuits.- Piezo effects in silicon.- Characterization of the piezojunction effect.- Minimizing the piezojunction and piezoresistive effects in integrated devices.- Minimizing the inaccuracy in packaged integrated circuits.- Stress-sensing elements based on the piezojunction effect.- Conclusions.

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