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OverviewAimed at electronics industry professionals, this 4th edition of the Boundary Scan Handbook describes recent changes to the IEEE1149.1 Standard Test Access Port and Boundary-Scan Architecture. This updated edition features new chapters on the possible effects of the changes on the work of the practicing test engineers and the new 1149.8.1 standard. Anyone needing to understand the basics of boundary scan and its practical industrial implementation will need this book. Provides an overview of the recent changes to the 1149.1 standard and the effect of the changes on the work of test engineers; Explains the new IEEE 1149.8.1 subsidiary standard and applications; Describes the latest updates on the supplementary IEEE testing standards. In particular, addresses: IEEE Std 1149.1 Digital Boundary-ScanIEEE Std 1149.4 Analog Boundary-ScanIEEE Std 1149.6 Advanced I/O TestingIEEE Std 1149.8.1 Passive Component TestingIEEE Std 1149.1-2013 The 2013 Revision of 1149.1IEEE Std 1532 In-System ConfigurationIEEE Std 1149.6-2015 The 2015 Revision of 1149.6 Full Product DetailsAuthor: Kenneth P. ParkerPublisher: Springer International Publishing AG Imprint: Springer International Publishing AG Edition: Softcover reprint of the original 4th ed. 2016 Weight: 8.774kg ISBN: 9783319330693ISBN 10: 3319330691 Pages: 552 Publication Date: 23 August 2016 Audience: Professional and scholarly , Professional & Vocational Format: Paperback Publisher's Status: Active Availability: Manufactured on demand  We will order this item for you from a manufactured on demand supplier. Table of ContentsBoundary-Scan Basics And Vocabulary.- Boundary-Scan Description Language (BSDL).- Boundary-Scan Testing.- Advanced Boundary-Scan Topics.- Design for Boundary-Scan Test.- Analog Measurement Basics.- IEEE 1149.4 Analog Boundary-Scan.- IEEE 1149.6 Testing Advanced I/O.- IEEE 1532:In-System Configuration.- IEEE 1149.8.1: Passive Components.- IEEE 1149.1:The 2013 Revision.- IEEE 1149.6: The 2015 Revision.ReviewsAuthor InformationDr. Kenneth P. Parker received his PHD at Stanford University. He has recently retired from a career with Hewlett-Packard and Agilent Technologies in the field of testing of electrical assemblies. Tab Content 6Author Website:Countries AvailableAll regions |
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