Testing Packaging Reliability and Applications of Semiconductor Lasers-Iv
Author:   Fallahi ,  Kurt J Linden ,  S.C. Wang (National Chiao Tung University, Taiwan, China)
Publisher:   SPIE Press
Volume:   Vol 3626
ISBN:  

9780819430960


Pages:   262
Publication Date:   30 April 1999
Format:   Paperback
Availability:   To order   Availability explained
Stock availability from the supplier is unknown. We will order it for you and ship this item to you once it is received by us.

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Testing Packaging Reliability and Applications of Semiconductor Lasers-Iv


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Author:   Fallahi ,  Kurt J Linden ,  S.C. Wang (National Chiao Tung University, Taiwan, China)
Publisher:   SPIE Press
Imprint:   SPIE Press
Volume:   Vol 3626
Weight:   0.635kg
ISBN:  

9780819430960


ISBN 10:   081943096
Pages:   262
Publication Date:   30 April 1999
Audience:   College/higher education ,  Professional and scholarly ,  Postgraduate, Research & Scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   To order   Availability explained
Stock availability from the supplier is unknown. We will order it for you and ship this item to you once it is received by us.

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