Overview

This book meets the vital need of providing one place where a comprehensive information on how to test more than one type of electronic component. The monograph gathers together data from scattered literature, including books, manufacturers' guides, instruction manuals, application notes and military and industry standards and provides a key information necessary to allow users to get started immediately on component testing and presents effective options for handling high-, low- and medium-volume testing.

Full Product Details

Author:   Richard Powell
Publisher:   Taylor & Francis Inc
Imprint:   CRC Press Inc
Volume:   38
Dimensions:   Width: 15.60cm , Height: 1.90cm , Length: 23.40cm
Weight:   0.498kg
ISBN:  

9780824777050

ISBN 10:   0824777050
Pages:   232
Publication Date:   12 March 1987
Audience:   College/higher education ,  Professional and scholarly ,  Undergraduate ,  Postgraduate, Research & Scholarly
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print  
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Richard F. Powell is Director of the Student Labortaory at The Gordon Institute, Wakefield, Massachusetts, a graduate school of engineering.

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