Testability Concepts for Digital ICs: The Macro Test Approach
Author:   F.P.M. Beenker ,  R.G. Bennetts ,  A.P. Thijssen
Publisher:   Kluwer Academic Publishers
Edition:   1995 ed.
Volume:   3
ISBN:  

9780792396581


Pages:   212
Publication Date:   30 November 1995
Format:   Hardback
Availability:   In Print   Availability explained
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Testability Concepts for Digital ICs: The Macro Test Approach


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Author:   F.P.M. Beenker ,  R.G. Bennetts ,  A.P. Thijssen
Publisher:   Kluwer Academic Publishers
Imprint:   Kluwer Academic Publishers
Edition:   1995 ed.
Volume:   3
Dimensions:   Width: 17.00cm , Height: 1.40cm , Length: 24.40cm
Weight:   1.100kg
ISBN:  

9780792396581


ISBN 10:   0792396588
Pages:   212
Publication Date:   30 November 1995
Audience:   Professional and scholarly ,  General/trade ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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