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OverviewIn Test Pattern Generation using Boolean Proof Engines, we give an introduction to ATPG. The basic concept and classical ATPG algorithms are reviewed. Then, the formulation as a SAT problem is considered. As the underlying engine, modern SAT solvers and their use on circuit related problems are comprehensively discussed. Advanced techniques for SAT-based ATPG are introduced and evaluated in the context of an industrial environment. The chapters of the book cover efficient instance generation, encoding of multiple-valued logic, usage of various fault models, and detailed experiments on multi-million gate designs. The book describes the state of the art in the field, highlights research aspects, and shows directions for future work. Full Product DetailsAuthor: Rolf Drechsler , Stephan Eggersglüß , Görschwin Fey , Daniel TillePublisher: Springer Imprint: Springer Edition: 2009 ed. Dimensions: Width: 15.50cm , Height: 1.20cm , Length: 23.50cm Weight: 1.040kg ISBN: 9789048123599ISBN 10: 9048123593 Pages: 192 Publication Date: 30 April 2009 Audience: Professional and scholarly , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: In Print  This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of ContentsPreliminaries.- Boolean Satisfiability.- SAT-Based ATPG.- Learning Techniques.- Multiple-Valued Logic.- Improved Circuit-to-CNF Conversion.- Branching Strategies.- Integration into Industrial Flow.- Delay Faults.- Summary and Outlook.ReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |
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