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OverviewFull Product DetailsAuthor: Yichuang Sun (Professor, University of Hertfordshire, UK)Publisher: Institution of Engineering and Technology Imprint: Institution of Engineering and Technology Dimensions: Width: 15.60cm , Height: 2.50cm , Length: 23.40cm Weight: 0.612kg ISBN: 9780863417450ISBN 10: 0863417450 Pages: 416 Publication Date: May 2008 Audience: College/higher education , Professional and scholarly , Tertiary & Higher Education , Professional & Vocational Format: Paperback Publisher's Status: Active Availability: In Print  This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of ContentsChapter 1: Fault diagnosis of linear and non-linear analogue circuits Chapter 2: Symbolic function approaches for analogue fault diagnosis Chapter 3: Neural-network-based approaches for analogue circuit fault diagnosis Chapter 4: Hierarchical/decomposition techniques for large-scale analogue diagnosis Chapter 5: DFT and BIST techniques for analogue and mixed-signal test Chapter 6: Design-for-testability of analogue filters Chapter 7: Test of A/D converters: From converter characteristics to built-in self-test proposals Chapter 8: Test of Sigma Delta converters Chapter 9: Phase-locked loop test methodologies: Current characterization and production test practices Chapter 10: On-chip testing techniques for RF wireless transceiver systems and components Chapter 11: Tuning and calibration of analogue, mixed-signal and RF circuitsReviewsAuthor InformationYichuang Sun received his Ph.D. from the University of York and is currently Professor at the University of Hertfordshire. His research interests are in analogue and mixed-signal, RF and communication circuits, circuit testing and fault diagnosis, coding and signal detection, space-time and MIMO communications, and wireless and mobile networks. He has published three books and over 180 papers. Professor Sun has been a book series editor for the IET, guest editor of four special issues for IET journals, and Track Chair and committee member for many international conferences. He is editor of ETRI Journal of South Korea and serves on several IEEE committees. Tab Content 6Author Website:Countries AvailableAll regions |
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