Tensorial Analysis of Networks (TAN) Modelling for PCB Signal Integrity and EMC Analysis

Author:   Blaise Ravelo (Professor, NUIST University, China) ,  Zhifei Xu (Postdoctoral Researcher, Missouri S&T EMC Laboratory, USA)
Publisher:   Institution of Engineering and Technology
ISBN:  

9781839530494


Pages:   400
Publication Date:   08 September 2020
Format:   Hardback
Availability:   In Print   Availability explained
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Tensorial Analysis of Networks (TAN) Modelling for PCB Signal Integrity and EMC Analysis


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Overview

This book describes a fast, accurate and flexible modelling methodology for PCBs. The model uses the concept of tensorial analysis of networks (TAN) based on Kron's and Kron-Branin's methods adapted for the EMC use by O. Maurice. The TAN approach is applied to the PCB SI and electromagnetic compatibility (EMC) analysis. Each chapter presents a methodology consisting of the problem formulation, classical circuit description, TAN primitive elements, TAN graph topology elaboration, problem metric mathematization and the posed-problem resolution based on Python and Matlab routine algorithms. This methodical approach has been applied to the following topics: basic knowledge to practice TAN for PCB SI/PI/EMC investigation; PCB primitive components analysis with TAN; analytical calculation of PCB trace Z/Y/T/S matrices with TAN approach; fast S-parameter Kron-Branin's modelling of rectangular wave guide (RWG) structure via mesh impedance reduction; time domain TAN modelling of PCB system with Kron's method; direct time-domain analysis with TAN method for PCB modelling; coupling between EM field and multilayer PCB with MKME; conducted emissions (CE) EMC TAN modelling; PCB conducted susceptibility (CS) EMC TAN modelling; PCB radiated susceptibility (RS) EMC TAN modelling; TAN model of loop probe coupling onto shielded coaxial short-cable; nonlinear behaviour conduced EMC model of an ADC based mixed PCB under radio frequency interference (RFI); far-field prediction combining simulations with near-field measurements for EMI assessment of PCBs; and element of information for numerical modelling on PCB. With its highly systematic approach to addressing TAN modelling methods, this book provides key information and novel solutions to the designers and manufacturers of analogue, RF, digital and mixed signal electronic circuits and systems.

Full Product Details

Author:   Blaise Ravelo (Professor, NUIST University, China) ,  Zhifei Xu (Postdoctoral Researcher, Missouri S&T EMC Laboratory, USA)
Publisher:   Institution of Engineering and Technology
Imprint:   Institution of Engineering and Technology
Dimensions:   Width: 15.60cm , Height: 2.50cm , Length: 23.40cm
Weight:   0.794kg
ISBN:  

9781839530494


ISBN 10:   1839530499
Pages:   400
Publication Date:   08 September 2020
Audience:   College/higher education ,  Professional and scholarly ,  Tertiary & Higher Education ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

Table of Contents

Chapter 1: General introduction Chapter 2: Basic knowledge to practice TAN for PCB SI/PI/EMC investigation Chapter 3: CB primitive components analysis with TAN Chapter 4: Analytical calculation of PCB trace Z/Y/T/S matrices with TAN approach Chapter 5: Fast S-parameter Kron-Branin's modelling of rectangular wave guide (RWG) structure via mesh impedance reduction Chapter 6: Time-domain TAN modelling of PCB-lumped system with Kron's method Chapter 7: Direct time-domain analysis with TAN method for distributed PCB modelling Chapter 8: Coupling between EM field and multilayer PCB with MKME Chapter 9: Conducted emissions (CEs) EMC TAN modelling Chapter 10: PCB-conducted susceptibility (CS) EMC TAN modelling Chapter 11: PCB-radiated susceptibility (RS) EMC TAN modelling Chapter 12: TAN model of loop probe coupling onto shielded coaxial short cable Chapter 13: Nonlinear behaviour conduced EMC model of an ADC-based mixed PCB under radio-frequency interference (RFI) Chapter 14: Far-field prediction combining simulations with near-field measurements for EMI assessment of PCBs Chapter 15: Element of information for numerical modelling on PCB: focus on boundary element method Chapter 16: General conclusion

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Author Information

Blaise Ravelo is a professor at NUIST University, China. His research interests include multiphysics and electronics engineering, and he is a pioneer of the negative group delay (NGD) concept. He was research director of nine PhD students and regularly involved in EU R&D&I-projects. He is member of IET Electronics Letters editorial board as circuit & system subject editor, and has (co)authored more than 250 papers in peer-reviewed journals and conferences. Zhifei Xu is a postdoctoral researcher at the Missouri S&T EMC Laboratory, Missouri University of Science and Technology, Rolla, USA. His research area covers signal integrity, power integrity and EMC analysis with different models on multilayer PCBs. His current publications are focused on the Kron-Branin model for multilayer PCB modeling applications.

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