Overview

"Tiny metal structures, less than a millionth of a meter across, are critical building blocks in a number of high-tech devices such as computer chips. These ""metallizations"" are subjected to extreme conditions of temperature, electric current density, and mechanical load, which may cause the device they are in to fail. This book contains research papers on these metallizations and on the reliability problems associated with them. The papers were peer reviewed for these proceedings."

Full Product Details

Author:   Shefford P. Baker ,  Matti A. Korhonen (Cornell University, Ithaca, NY, USA) ,  Eduard Arzt ,  P. S. Ho
Publisher:   American Institute of Physics
Imprint:   American Institute of Physics
Volume:   v. 612
Dimensions:   Width: 15.50cm , Height: 1.50cm , Length: 23.50cm
Weight:   0.548kg
ISBN:  

9780735400580

ISBN 10:   073540058
Pages:   260
Publication Date:   09 April 2002
Audience:   Professional and scholarly ,  College/higher education ,  Professional & Vocational ,  Postgraduate, Research & Scholarly
Format:   Hardback
Publisher's Status:   Unknown
Availability:   In Print  
Limited stock is available. It will be ordered for you and shipped pending supplier's limited stock.

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