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OverviewFull Product DetailsAuthor: Amir ZjajoPublisher: Springer Imprint: Springer Edition: Softcover reprint of the original 1st ed. 2014 Volume: 48 Dimensions: Width: 15.50cm , Height: 1.10cm , Length: 23.50cm Weight: 3.285kg ISBN: 9789402402858ISBN 10: 9402402853 Pages: 192 Publication Date: 23 August 2016 Audience: Professional and scholarly , Professional & Vocational Format: Paperback Publisher's Status: Active Availability: Manufactured on demand  We will order this item for you from a manufactured on demand supplier. Table of Contents1 Introduction.- 2 Random Process Variation in Deep-Submicron CMOS.- 3 Electronic Noise in Deep-Submicron CMOS.- 4 Thermal Effects in Deep-Submicron CMOS.- 5 Circuit Solutions.- 6 Conclusions and Recommendations.- Appendix. References.- Acknowledgement.- About the Author.ReviewsAuthor InformationAmir Zjajo received the M.Sc. and DIC degrees from the Imperial College London, London, U.K., in 2000 and the Ph.D. degree from Eindhoven University of Technology, Eindhoven, The Netherlands in 2010, all in electrical engineering. In 2000, he joined Philips Research Laboratories as a member of the research staff in the Mixed-Signal Circuits and Systems Group. From 2006 until 2009, he was with Corporate Research of NXP Semiconductors as a senior research scientist. In 2009, he joined Delft University of Technology as a Faculty member in the Circuit and Systems Group. Dr. Zjajo has published more than 70 papers in referenced journals and conference proceedings, and holds more than 10 US patents or patents pending. He is the author of the book Low-Voltage High-Resolution A/D Converters: Design, Test and Calibration (Springer, 2011, Chinese translation, 2012). He serves as a member of Technical Program Committee of IEEE Design, Automation and Test in Europe Conference, IEEE International Symposium on Circuits and Systems and IEEE International Mixed-Signal Circuits, Sensors and Systems Workshop. His research interests include mixed-signal circuit design, signal integrity and timing and yield optimization. Tab Content 6Author Website:Countries AvailableAll regions |
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