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OverviewSince process variation and chip performance uncertainties have become more pronounced as technologies scale down into the nanometer regime, accurate and efficient modeling or characterization of variations from the device to the architecture level have become imperative for the successful design of VLSI chips. This book provides readers with tools for variation-aware design methodologies and computer-aided design (CAD) of VLSI systems, in the presence of process variations at the nanometer scale. It presents the latest developments for modeling and analysis, with a focus on statistical interconnect modeling, statistical parasitic extractions, statistical full-chip leakage and dynamic power analysis considering spatial correlations, statistical analysis and modeling for large global interconnects and analog/mixed-signal circuits. Provides readers with timely, systematic and comprehensive treatments of statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks, and analog/mixed-signal circuits; Helps chip designers understand the potential and limitations of their design tools, improving their design productivity; Presents analysis of each algorithm with practical applications in the context of real circuit design; Includes numerical examples for the quantitative analysis and evaluation of algorithms presented. Provides readers with timely, systematic and comprehensive treatments of statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks, and analog/mixed-signal circuits; Helps chip designers understand the potential and limitations of their design tools, improving their design productivity; Presents analysis of each algorithm with practical applications in thecontext of real circuit design; Includes numerical examples for the quantitative analysis and evaluation of algorithms presented. Full Product DetailsAuthor: Ruijing Shen , Sheldon X.-D. Tan , Hao YuPublisher: Springer-Verlag New York Inc. Imprint: Springer-Verlag New York Inc. Edition: 2012 Dimensions: Width: 15.50cm , Height: 1.90cm , Length: 23.50cm Weight: 0.670kg ISBN: 9781461407874ISBN 10: 1461407877 Pages: 306 Publication Date: 18 March 2012 Audience: Professional and scholarly , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: Manufactured on demand  We will order this item for you from a manufactured on demand supplier. Table of ContentsFundamentals of Statistical Analysis.- Statistical Full-Chip Leakage Power Analysis.- Statistical Full-Chip Dynamic Power Analysis.- Statistical Parasitic Extraction.- Statistical Compact Modeling and Reduction of Interconnects.- Statistical Analysis of Global Interconnects.- Statistical Analysis and Modeling for Analog and Mixed-Signal Circuits.ReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |
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