Statistical Metrology: 6th International Workshop
Author:   Institute of Electrical and Electronics Engineers
Publisher:   I.E.E.E.Press
ISBN:  

9780780366886


Pages:   100
Publication Date:   01 January 2001
Format:   Paperback
Availability:   In Print   Availability explained
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Statistical Metrology: 6th International Workshop


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Overview

The proceedings of the 6th International Workshop on Statistical Metrology, held in 2001. The papers cover: yield ramping methodology; metrology for statistical process control; sensor and measurement technology; spatial and temporal variation analysis methods; robust design; and more.

Full Product Details

Author:   Institute of Electrical and Electronics Engineers
Publisher:   I.E.E.E.Press
Imprint:   I.E.E.E.Press
ISBN:  

9780780366886


ISBN 10:   0780366883
Pages:   100
Publication Date:   01 January 2001
Audience:   College/higher education ,  Professional and scholarly ,  General/trade ,  Undergraduate ,  Postgraduate, Research & Scholarly
Format:   Paperback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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