Sputtering Materials for VLSI and Thin Film Devices

Author:   Jaydeep Sarkar (Engineering Consultant at Praxair Inc., Orangeburg, New York, USA) ,  Paul S. Gilman
Publisher:   William Andrew Publishing
ISBN:  

9780815515937


Pages:   608
Publication Date:   29 October 2013
Format:   Hardback
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

Our Price $525.36 Quantity:  
Add to Cart

Share |

Sputtering Materials for VLSI and Thin Film Devices


Add your own review!

Overview

An important resource for students, engineers and researchers working in the area of thin film deposition using physical vapor deposition (e.g. sputtering) for semiconductor, liquid crystal displays, high density recording media and photovoltaic device (e.g. thin film solar cell) manufacturing. This book also reviews microelectronics industry topics such as history of inventions and technology trends, recent developments in sputtering technologies, manufacturing steps that require sputtering of thin films, the properties of thin films and the role of sputtering target performance on overall productivity of various processes. Two unique chapters of this book deal with productivity and troubleshooting issues. The content of the book has been divided into two sections: (a) the first section (Chapter 1 to Chapter 3) has been prepared for the readers from a range of disciplines (e.g. electrical, chemical, chemistry, physics) trying to get an insight into use of sputtered films in various devices (e.g. semiconductor, display, photovoltaic, data storage), basic of sputtering and performance of sputtering target in relation to productivity, and (b) the second section (Chapter 4 to Chapter 8) has been prepared for readers who already have background knowledge of sputter deposition of thin films, materials science principles and interested in the details of sputtering target manufacturing methods, sputtering behavior and thin film properties specific to semiconductor, liquid crystal display, photovoltaic and magnetic data storage applications. In Chapters 5 to 8, a general structure has been used, i.e. a description of the applications of sputtered thin films, sputtering target manufacturing methods (including flow charts), sputtering behavior of targets (e.g. current - voltage relationship, deposition rate) and thin film properties (e.g. microstructure, stresses, electrical properties, in-film particles). While discussing these topics, attempts have been made to include examples from the actual commercial processes to highlight the increased complexity of the commercial processes with the growth of advanced technologies. In addition to personnel working in industry setting, university researchers with advanced knowledge of sputtering would also find discussion of such topics (e.g. attributes of target design, chamber design, target microstructure, sputter surface characteristics, various troubleshooting issues) useful. .

Full Product Details

Author:   Jaydeep Sarkar (Engineering Consultant at Praxair Inc., Orangeburg, New York, USA) ,  Paul S. Gilman
Publisher:   William Andrew Publishing
Imprint:   William Andrew Publishing
Weight:   1.300kg
ISBN:  

9780815515937


ISBN 10:   0815515936
Pages:   608
Publication Date:   29 October 2013
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

Table of Contents

Chapter 1:  Sputtering materials for microelectronic industry Chapter 2:  Sputter deposition of thin films Chapter 3:  Performance of sputtering targets and productivity Chapter 4:  Sputtering target manufacturing Chapter 5:  Sputtering targets for integrated circuits Chapter 6:  Sputtering targets for displays and photovoltaic devices Chapter 7:  Ferromagnetic sputtering targets for silicide and data storage applications Chapter 8:  Troubleshooting Appendix I Diffusion and phase transformation Appendix II Crystallographic texture Appendix III Phase change materials Appendix IV Mechanical property evaluation Appendix V Units and conversion factors Appendix VI Periodic table

Reviews

Author Information

Engineering Consultant at Praxair Inc., Orangeburg, New York, USA

Tab Content 6

Author Website:  

Customer Reviews

Recent Reviews

No review item found!

Add your own review!

Countries Available

All regions
Latest Reading Guide

lgn

al

Shopping Cart
Your cart is empty
Shopping cart
Mailing List