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OverviewFull Product DetailsAuthor: Willem Dirk van Driel , Xuejun Fan , Guo Qi Zhang , Kouchi ZhangPublisher: Springer International Publishing AG Imprint: Springer International Publishing AG Edition: 1st ed. 2018 Volume: 3 Weight: 1.371kg ISBN: 9783319581743ISBN 10: 3319581740 Pages: 606 Publication Date: 20 July 2017 Audience: Professional and scholarly , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: Manufactured on demand  We will order this item for you from a manufactured on demand supplier. Table of ContentsIntroduction.- Degradation of Epitaxial Layers in LEDs.- Advances in Reliability Testing and Standards Development for LED Packages and System.- Lifetime Assessment of Optical Materials in LED-based Products.- Characterization of Die-Attach Thermal Interface of High Power Light Emitting Diodes: An Optical/Electrical/Thermal Inverse Approach.- LED-based Luminaire Color Shift Acceleration and Prediction.- Fault Diagnostics and Lifetime Prognostics for Phosphor-Converted White LED Packages.- Online Testing Method and System of LED Reliability and their Applications.- Degradation Mechanisms of Mid-Power White-Light LEDs.- Driver Reliability: Failure Modes.- Driver Reliability: A Physics of Failure Approach for Driver Reliability Prediction.- Reliability of Connectors.- Reliability of Complex Systems, Including Software.ReviewsAuthor InformationWillem Dirk van Driel is the Solid State Lightning Reliability Program Manager for Philips Lighting Eindhoven, and is Assistant Professor of Micro/Nano Reliability at Delft University of Technology, in the Electronic Components, Technology and Materials Department. Xuejun Fan is Professor in the Department of Mechanical Engineering at Lamar University. G.Q. Zhang is Professor of Micro/Nanoelectronics, System Integration and Reliability (MSI&R) at the Delft University of Technology. Tab Content 6Author Website:Countries AvailableAll regions |
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