Overview

Soft errors are a multifaceted issue at the crossroads of applied physics and engineering sciences. Soft errors are by nature multiscale and multiphysics problems that combine not only nuclear and semiconductor physics, material sciences, circuit design, and chip architecture and operation, but also cosmic-ray physics, natural radioactivity issues, particle detection, and related instrumentation. Soft Errors: From Particles to Circuits addresses the problem of soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment one of the most important primary limits for modern digital electronic reliability. Covering the fundamentals of soft errors as well as engineering considerations and technological aspects, this robust text:

• Discusses the basics of the natural radiation environment, particle interactions with matter, and soft-error mechanisms
• Details instrumentation developments in the fields of environment characterization, particle detection, and real-time and accelerated tests
• Describes the latest computational developments, modeling, and simulation strategies for the soft error-rate estimation in digital circuits
• Explores trends for future technological nodes and emerging devices

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9781322999029

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Reviews

The few radiation effects books out there are focused on space environments or simply on MOSFET degradation. This book is focused on the terrestrial environment and goes from basic physics and devices to final product applications, and thus should appeal to a much broader audience than other texts. Soft errors induced from the terrestrial or ground-level radiation environment dominate failures in virtually all electronic systems. In many cases, these failures are uneventful or undetected, but in many critical or largely parallel systems (such as safety systems in planes and cars or network systems or servers with thousands of devices) soft errors are a critical problem that needs to be addressed during the design of the product and system. This book goes a long way in educating future and existing engineers on how to determine the causes and magnitude of the problem in such systems. [Its strengths are its] focus on the terrestrial environment and the breadth of coverage from particle to device including characterization and modeling techniques. Robert Baumann, Texas Instruments, Dallas, USA

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