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OverviewFull Product DetailsAuthor: Selahattin SayilPublisher: Springer International Publishing AG Imprint: Springer International Publishing AG Edition: 1st ed. 2016 Dimensions: Width: 15.50cm , Height: 0.80cm , Length: 23.50cm Weight: 0.454kg ISBN: 9783319306063ISBN 10: 3319306065 Pages: 105 Publication Date: 04 March 2016 Audience: Professional and scholarly , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: Manufactured on demand  We will order this item for you from a manufactured on demand supplier. Table of ContentsReviewsBook gives wide perspectives on the technical insights of fundamentals of sources and mitigation strategies of soft error rates in semiconductor memory devices ... . a valuable addition to a scientific library, as well as served as good introduction for memory reliability engineers or specialists and industrials involved in the field of memory device reliability. This book is highly recommended for people who desire a better understanding of the theory and practice of SER and technical considerations in SER mitigations. (Chong Leong Gan, Microelectronics Reliability, Vol. 74 (81), 2017) Author InformationDr. Selahattin Sayil is an Associate Professor in the Philip M. Drayer Department of Electrical Engineering at Lamar University. His research focuses on Radiation effects modeling and hardening at the circuit level, Reliability analysis of low power designs, and Interconnect modeling and noise prediction. Tab Content 6Author Website:Countries AvailableAll regions |
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