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OverviewProviding a comprehensive discussion of SEU, this text should be of interest to designers of satellite electronics systems and missile systems. It should also be helpful in achieving the hardened designs that are necessary to protect these systems. The book should be of interest to electrical and electronic engineers; spacecraft and satellite design engineers; aircraft and aerospace designers and engineers in both military and commercial industries; and missile system engineers. Full Product DetailsAuthor: G.C. Messenger , Milton AshPublisher: Chapman and Hall Imprint: Chapman and Hall Dimensions: Width: 15.20cm , Height: 2.50cm , Length: 22.90cm Weight: 1.600kg ISBN: 9780412097317ISBN 10: 0412097311 Pages: 351 Publication Date: 30 June 1997 Audience: College/higher education , Professional and scholarly , Postgraduate, Research & Scholarly , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: In Print This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of Contents1 Preliminaries.- 1.1 Introduction.- 1.2 Fluence, Flux, and Current Density.- 1.3 Cross Sections.- 1.4 Chord Distribution Functions.- Problems.- References.- 2 Extraterrestrial SEU-Inducing Particles.- 2.1 Introduction.- 2.2 Cosmic Rays.- 2.3 Other Cosmic Ray Particles.- 2.4 Alpha Particles.- 2.5 Solar Flares.- 2.6 Van Allen Radiation Belts.- Problems.- References.- 3 Particle Penetration and Energy Deposition.- 3.1 Introduction.- 3.2 Particle Penetration in Materials.- 3.3 Range.- 3.4 Ionization Loss.- 3.5 Bremsstrahlung Loss.- 3.6 Pair Production, Cosmic Ray Showers.- 3.7 LET Introduction.- 3.8 LET Spectra (Heinrich) Curve.- 3.9 Linear Energy Transfer (LET) Applicability.- Problems.- References.- 4 Single Event Upset: Experimental.- 4.1 Introduction.- 4.2 Heavy-Ion Accelerators.- 4.3 Critical LET, Critical Charge.- 4.4 Californum-252 Sources.- 4.5 Lasers.- Problems.- References.- 5 Single Event Upset Error Rates.- 5.1 Introduction.- 5.2 Geosynchronous SEU.- 5.3 Proton-Induced SEU.- 5.4 Neutron-Induced SEU.- 5.5 Alpha-Particle-Induced SEU.- 5.6 Ground-Level SEU.- Problems.- References.- 6 Single Event Phenomena I.- 6.1 Introduction.- 6.2 Funneling.- 6.3 Track Transport.- 6.4 SEU Cross-Section Morphology.- 6.5 Device SEU Scaling.- 6.6 Single Event Latchup.- 6.7 South Atlantic Anomaly, Low Earth Orbits.- 6.8 Single Event Gate Rupture, Device SEU Burnout.- Problems.- References.- 7 Single Event Phenomena II.- 7.1 Introduction.- 7.2 Multiple Event Upsets.- 7.3 Ionizing Dose Effects.- 7.4 Redundancy, Scrubbing.- 7.5 Error Detection and Correction.- 7.6 SEU Shielding.- 7.7 Radiation Sensors and Detectors.- Problems.- References.- 8 Single Event Upset Practice.- 8.1 Introduction.- 8.2 Geosynchronous SEU Error Rate Computations.- 8.3 Proton-Induced SEU II.- 8.4 Neutron-InducedSEU II.- 8.5 Single Event Latchup II.- 8.6 Single Event Burnout II.- 8.7 Guidelines.- Glossary for Tables 8.13–8.17.- Appendices 8.1–8.3.- Problems.- References.ReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |