Overview

The primary focus of this book is on basic device concepts, memory cell design, and process technology integration. The first part provides in-depth coverage of conventional nonvolatile memory devices, stack structures from device physics, historical perspectives, and identifies limitations of conventional devices. The second part reviews advances made in reducing and/or eliminating existing limitations of NVM device parameters from the standpoint of device scalability, application extendibility, and reliability. The final part proposes multiple options of silicon based unified (nonvolatile) memory cell concepts and stack designs (SUMs). The book provides Industrial R&D personnel with the knowledge to drive the future memory technology with the established silicon FET-based establishments of their own. It explores application potentials of memory in areas such as robotics, avionics, health-industry, space vehicles, space sciences, bio-imaging, genetics etc.

Full Product Details

Author:   Arup Bhattacharyya (CEO, ADI Associates (Single Individual Technical Consultancy), Essex Junction, Vermont, USA)
Publisher:   Taylor & Francis Ltd
Imprint:   CRC Press
Weight:   1.318kg
ISBN:  

9781138746329

ISBN 10:   1138746320
Pages:   512
Publication Date:   08 August 2017
Audience:   College/higher education ,  Professional and scholarly ,  Tertiary & Higher Education ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   In Print  
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

Table of Contents

PART I CONVENTIONAL SILICON BASED NVM DEVICES. SILICON BASED DIGITAL MEMORIES AND NVMs: AN INTRODUCTORY OVERVIEW. HISTORICAL PROGRESSION OF NVM DEVICES. GENERAL PROPERTIES OF DIELECTRICS AND INTERFACE FOR NVM DEVICES. ELECTRIC FILMS FOR NVM DEVICES. NVM UNIQUE DEVICE PROPERTIES. NVM DEVICE STACK DESIGN. NVM CELLS, ARRAYS AND DISTURBS. NVM PROCESS TECHNOLOGY AND INTEGRATION SCHEME. NVM DEVICE RELIABILITY. CONVENTIONAL NVM CHALLENGES. PART II ADVANCED NVM DEVICES AND TECHNOLOGY. VOLTAGE SCALABILITY. HIGH-K DIELECTRICS FILMS FOR NVM. BAND ENGINEERING FOR NVM DEVICES. ENHANCED TECHNOLOGY INTEGRATION FOR NVM. PLANAR MULTILEVEL STORAGE NVM DEVICES. NON PLANAR AND 3D DEVICES AND ARRAYS. EMERGING NVMs & LIMITATIONS OF CURRENT NVM DEVICES. ADVANCED SILICON-BASED NVM DEVICE CONCEPTS. PART III: SUM: SILICON BASED UNIFIED MEMORY. SUM PERSPECTIVE, DEVICE CONCEPTS AND POTENTIALS. SUM TECHNOLOGY. BAND ENGINEERING FOR SUM DEVICES. UNIFUNCTIONAL SUM: THE USUM CELLS AND ARRAY. MULTIFUNCTIONAL SUM: THE MSUM CELLS AND ARRAYS. SUM FUNCTIONAL INTEGRATION, PACKAGING AND POTENTIAL APPLICATION.

Reviews

This book gives a very good overview of existing and emerging NVM technologies. This is going to be a valuable reference book for both undergraduate and postgraduate students. The book benefits from the detailed description of technologies and structures of NVM devices. It shows the variety and differences between all known NVM structures. The book should also help VLSI designers to better understand advantages and drawbacks of different NVM structures. - Sergei Skorobogatov, University of Cambridge, UK

""This book gives a very good overview of existing and emerging NVM technologies. This is going to be a valuable reference book for both undergraduate and postgraduate students. The book benefits from the detailed description of technologies and structures of NVM devices. It shows the variety and differences between all known NVM structures. The book should also help VLSI designers to better understand advantages and drawbacks of different NVM structures."" — Sergei Skorobogatov, University of Cambridge, UK

This book gives a very good overview of existing and emerging NVM technologies. This is going to be a valuable reference book for both undergraduate and postgraduate students. The book benefits from the detailed description of technologies and structures of NVM devices. It shows the variety and differences between all known NVM structures. The book should also help VLSI designers to better understand advantages and drawbacks of different NVM structures. - Sergei Skorobogatov, University of Cambridge, UK

Author Information

Dr. Arup Bhattacharyya has forty years of leadership and pioneering contributions in the area of microelectronics and nanoelectronics. He has contributed pioneering activities and innovations in process, device, interconnect, and integration of many generations of microelectronics and nano-electronics. His inventions include nearly 300 U.S. and international Patents and invention publications in technologies such as CCD, BIPOLAR, FET, NVM, FLASH, ANTIFUSE, SOI, BICMOS, SOLAR-CELLS, and SOC. Some of the applications of Dr. Bhattacharyya's inventions include electronic Memories, Microprocessors and Controllers, Random and Programmable Logic Devices, Nonvolatile Devices, Energy-conversion devices, ASICs, ASDs, and SMART Electronic Devices. He has experience in R&D leadership, Program management and Technology transfer, Technical Education and Consultancy, Strategic Planning, Infrastructure Development, Product Development, and Manufacturability. Additional experiences include University teaching, volunteering for science and engineering promotion, service to professional organizations, and consultancy to the UN.

Tab Content 6

Author Website:  

Customer Reviews

Recent Reviews

No review item found!

Add your own review!

Countries Available

All regions