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OverviewFull Product DetailsAuthor: Jiann S. YuanPublisher: John Wiley and Sons Ltd Imprint: John Wiley & Sons Inc Dimensions: Width: 16.80cm , Height: 2.70cm , Length: 24.70cm Weight: 0.798kg ISBN: 9780471197461ISBN 10: 0471197467 Pages: 488 Publication Date: 12 April 1999 Audience: College/higher education , Professional and scholarly , Undergraduate , Postgraduate, Research & Scholarly Format: Hardback Publisher's Status: Out of Stock Indefinitely Availability: Out of stock  Table of ContentsMaterial Properties and Technologies. DC Performance. RF and Transient Performance. HBT Modeling. Heterojunction Device Simulation. Breakdown and Thermal Instability. Reliability. RF and Digital Circuits for Low-Voltage Applications. Index.ReviewsAuthor InformationJIANN S. YUAN, PhD, is Associate Professor of Electrical Engineering at the University of Central Florida. Widely published in the area of HBT technology, Dr. Yuan is also the author of Semiconductor Device Physics, Simulation, and Analysis. Tab Content 6Author Website:Countries AvailableAll regions |
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