Semiconductor Interfaces: Formation and Properties. Proceedings of the Workshop, Les Houches, France, February 24 - March 6, 1987

Author:   Guy Lelay ,  Jacques Derrien ,  Nino Boccara
Publisher:   Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Edition:   Interface formation including molecular beam epitaxy the fabrication of artificially layere
ISBN:  

9783540183280


Pages:   400
Publication Date:   16 November 1987
Format:   Hardback
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

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Semiconductor Interfaces: Formation and Properties. Proceedings of the Workshop, Les Houches, France, February 24 - March 6, 1987


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Overview

The trend towards miniaturisation of microelectronic devices and the search for exotic new optoelectronic devices based on multilayers confer a crucial role on semiconductor interfaces. Great advances have recently been achieved in the elaboration of new thin film materials and in the characterization of their interfacial properties, down to the atomic scale, thanks to the development of sophisticated new techniques. This book is a collection of lectures that were given at the International Winter School on Semiconductor Interfaces: Formation and Properties held at the Centre de Physique des Rouches from 24 February to 6 March, 1987. The aim of this Winter School was to present a comprehensive review of this field, in particular of the materials and methods, and to formulate recom mendations for future research. The following topics are treated: (i) Interface formation. The key aspects of molecular beam epitaxy are emphasized, as well as the fabrication of artificially layered structures, strained layer superlattices and the tailoring of abrupt doping profiles. (ii) Fine characterization down to the atomic scale using recently devel oped, powerful techniques such as scanning tunneling microscopy, high reso lution transmission electron microscopy, glancing incidence x-ray diffraction, x-ray standing waves, surface extended x-ray absorption fine structure and surface extended energy-loss fine structure. (iii) Specific physical properties of the interfaces and their prospective applications in devices. We wish to thank warmly all the lecturers and participants, as well as the organizing committee, who made this Winter School a success.""

Full Product Details

Author:   Guy Lelay ,  Jacques Derrien ,  Nino Boccara
Publisher:   Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Imprint:   Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Edition:   Interface formation including molecular beam epitaxy the fabrication of artificially layere
Weight:   0.790kg
ISBN:  

9783540183280


ISBN 10:   3540183280
Pages:   400
Publication Date:   16 November 1987
Audience:   College/higher education ,  Professional and scholarly ,  Undergraduate ,  Postgraduate, Research & Scholarly
Format:   Hardback
Publisher's Status:   Active
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

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