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Author:   Ming Fu Li (Fudan Univ, China & Nus, S'pore)
Publisher:   Imperial College Press
Imprint:   Imperial College Press
Dimensions:   Width: 16.00cm , Height: 2.50cm , Length: 23.10cm
Weight:   0.885kg
ISBN:  

9781848164062

ISBN 10:   1848164068
Pages:   528
Publication Date:   03 March 2011
Audience:   College/higher education ,  Professional and scholarly ,  Tertiary & Higher Education ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print  
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Table of Contents

Defects in Semiconductors; Semiconductor Band Structures; Analog Integrated Circuit Design; CMOS Device Reliability; CMOS Technology; Nano CMOS Device Quantum Simulation.

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