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OverviewFull Product DetailsAuthor: Yasuo Cho (Tohoku University, Japan) , Yasuo Cho (Tohoku University, Japan) , Yasuo Cho (Tohoku University, Japan) , Yasuo Cho (Tohoku University, Japan)Publisher: Elsevier Science Publishing Co Inc Imprint: Woodhead Publishing Weight: 0.420kg ISBN: 9780128172469ISBN 10: 0128172460 Pages: 256 Publication Date: 21 May 2020 Audience: Professional and scholarly , Professional & Vocational Format: Paperback Publisher's Status: Active Availability: Manufactured on demand  We will order this item for you from a manufactured on demand supplier. Table of Contents1. Principals of scanning nonlinear dielectric microscopy for measuring ferroelectric and dielectric polarization 2. Ferroelectric polarization measurement 3. Three-dimensional polarization measurement 4. Ultra high-density ferroelectric data storage using scanning nonlinear dielectric microscopy 5. Linear permittivity measurement by scanning nonlinear dielectric microscopy 6. Noncontact scanning nonlinear dielectric microscopy 7. Scanning nonlinear dielectric potentiometry for measurement of the potential induced by atomic dipole measurements 8. Principles of scanning nonlinear dielectric microscopy for semiconductor measurements 9. Carrier distribution measurement in semiconductor materials and devices 10. Super-higher-order scanning nonlinear dielectric microscopy 11. Local deep-level transient spectroscopy 12. Time-resolved scanning nonlinear dielectric microscopyReviewsAuthor InformationYasuo Cho graduated in 1980 from Tohoku University in electrical engineering department. In 1985 he became a research associate at Research Institute of Electrical Communication Tohoku University. In 1990, he received an associate professorship from Yamaguchi University. He then became an associate professor in 1997 and a full professor in 2001 at Research Institute of Electrical Communication Tohoku University. During this time, his main research interests included nonlinear phenomena in ferroelectric materials and their applications, research on the scanning nonlinear dielectric microscopy (SNDM), and research on using the SNDM in next-generation ultrahigh density ferroelectric data storage (SNDM ferroelectric probe memory). Tab Content 6Author Website:Countries AvailableAll regions |
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