Robust Computing with Nano-scale Devices: Progresses and Challenges

Author:   Chao Huang
Publisher:   Springer
Edition:   2010 ed.
Volume:   58
ISBN:  

9789048185399


Pages:   180
Publication Date:   26 March 2010
Format:   Hardback
Availability:   Awaiting stock   Availability explained
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Robust Computing with Nano-scale Devices: Progresses and Challenges


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Overview

Robust Nano-Computing focuses on various issues of robust nano-computing, defect-tolerance design for nano-technology at different design abstraction levels. It addresses both redundancy- and configuration-based methods as well as fault detecting techniques through the development of accurate computation models and tools. The contents present an insightful view of the ongoing researches on nano-electronic devices, circuits, architectures, and design methods, as well as provide promising directions for future research.

Full Product Details

Author:   Chao Huang
Publisher:   Springer
Imprint:   Springer
Edition:   2010 ed.
Volume:   58
Dimensions:   Width: 15.50cm , Height: 1.20cm , Length: 23.50cm
Weight:   0.990kg
ISBN:  

9789048185399


ISBN 10:   9048185394
Pages:   180
Publication Date:   26 March 2010
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Awaiting stock   Availability explained
The supplier is currently out of stock of this item. It will be ordered for you and placed on backorder. Once it does come back in stock, we will ship it out for you.

Table of Contents

Fault Tolerant Nanocomputing.- Transistor-Level Based Defect-Tolerance for Reliable Nanoelectronics.- Fault-Tolerant Design for Nanowire-Based Programmable Logic Arrays.- Built-In Self-Test and Defect Tolerance for Molecular Electronics-Based NanoFabrics.- The Prospect and Challenges of CNFET Based Circuits: A Physical Insight.- Computing with Nanowires: A Self Assembled Neuromorphic Architecture.- Computational Opportunities and CAD for Nanotechnologies.

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