Overview

This text is dedicated to the issues surrounding RFIC (radio-frequency integrated circuit) testing. It explains how to perform high-accuracy RF measurements of die and packages in the RF test lab. It defines the essential elements in an RF system, explains where errors can be found in such a system and shows how to mathematically remove them with calibration. This book should be of interest to: RFIC designers and high-frequency digital IC designers, IC test engineers and IC manufacturing test engineers.

Full Product Details

Author:   Scott Wartenberg
Publisher:   Artech House Publishers
Imprint:   Artech House Publishers
Dimensions:   Width: 15.60cm , Height: 1.40cm , Length: 23.40cm
Weight:   0.520kg
ISBN:  

9781580532730

ISBN 10:   158053273
Pages:   244
Publication Date:   31 May 2002
Audience:   Professional and scholarly ,  General/trade ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Awaiting stock  
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Table of Contents

Preface. Introduction, Calibration, Coplanar Probes. High-Volume Probing. Test Fixtures. On-Wafer Characterization. RF Test Systems. Package Characterization. Future Trends. Appendix.

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