Reliability, Testing and Characterization of MEMS/MOEMS: II (Proceedings of SPIE)
Author:   Ramesham ,  Danelle M. Tanner
Publisher:   SPIE Press
Edition:   illustrated edition
Volume:   Vol 4980
ISBN:  

9780819447807


Pages:   378
Publication Date:   31 January 2003
Format:   Paperback
Availability:   To order   Availability explained
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Reliability, Testing and Characterization of MEMS/MOEMS: II (Proceedings of SPIE)


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Author:   Ramesham ,  Danelle M. Tanner
Publisher:   SPIE Press
Imprint:   SPIE Press
Edition:   illustrated edition
Volume:   Vol 4980
ISBN:  

9780819447807


ISBN 10:   0819447803
Pages:   378
Publication Date:   31 January 2003
Audience:   College/higher education ,  Professional and scholarly ,  General/trade ,  Undergraduate ,  Postgraduate, Research & Scholarly
Format:   Paperback
Publisher's Status:   Active
Availability:   To order   Availability explained
Stock availability from the supplier is unknown. We will order it for you and ship this item to you once it is received by us.

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