Reliability, Robustness and Failure Mechanisms of LED Devices: Methodology and Evaluation

Author:   Yannick Deshayes (Associate Professor, University of Bordeaux, France) ,  Laurent Bechou (Université de Sherbrooke)
Publisher:   ISTE Press Ltd - Elsevier Inc
ISBN:  

9781785481529


Pages:   172
Publication Date:   23 September 2016
Format:   Hardback
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

Our Price $196.65 Quantity:  
Add to Cart

Share |

Reliability, Robustness and Failure Mechanisms of LED Devices: Methodology and Evaluation


Add your own review!

Overview

The rapid growth of the use of optoelectronic technology in Information and Communications Technology (ICT) has seen a complementary increase in the performance of such technologies. As a result, optoelectronic technologies have replaced the technology of electronic interconnections. However, the control of manufacturing techniques for optoelectronic systems is more delicate than that of microelectronic technologies.This practical resource, divided into four chapters, examines several methods for determining the reliability of infrared LED devices. The primary interest of this book focuses on methods of extracting fundamental parameters from the electrical and optical characterization of specific zones in components. Failure mechanisms are identified based on measured performance before and after aging tests. Knowledge of failure mechanisms allows formulation of degradation laws, which in turn allow an accurate lifetime distribution for specific devices to be proposed.

Full Product Details

Author:   Yannick Deshayes (Associate Professor, University of Bordeaux, France) ,  Laurent Bechou (Université de Sherbrooke)
Publisher:   ISTE Press Ltd - Elsevier Inc
Imprint:   ISTE Press Ltd - Elsevier Inc
Dimensions:   Width: 15.20cm , Height: 1.40cm , Length: 22.90cm
Weight:   0.300kg
ISBN:  

9781785481529


ISBN 10:   1785481525
Pages:   172
Publication Date:   23 September 2016
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

Table of Contents

1: State-of-the-Art of Infrared Technology 2: Analysis and Models of an LED 3: Physics of Failure Principles 4: Methodologies of Reliability Analysis

Reviews

Author Information

Yannick Deshayes is Associate Professor at the University of Bordeaux, France. His research focuses on the physics of failure, from photonics materials to complex devices. He develops quantum theory to establish degradation laws on photonics devices for LED, laser and photonics applications.. Laurent Béchou is Full Professor in Electronics and Physics at the University of Bordeaux, France, and Visiting Senior Researcher at the Laboratoire Nanotechnologies et Nanosystèmes (CNRS) at the University of Sherbrooke, Canada. His research mainly addresses advanced electro-optical characterization techniques, physical and failure mechanisms modeling, as well as statistical methods for lifetime prediction of optical devices and emerging photonic systems.

Tab Content 6

Author Website:  

Customer Reviews

Recent Reviews

No review item found!

Add your own review!

Countries Available

All regions
Latest Reading Guide

lgn

al

Shopping Cart
Your cart is empty
Shopping cart
Mailing List