Reliability of Nanoscale Circuits and Systems: Methodologies and Circuit Architectures
Publisher:   Springer New York
ISBN:  

9781282972568


Pages:   223
Publication Date:   01 January 2011
Format:   Electronic book text
Availability:   In stock   Availability explained
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Reliability of Nanoscale Circuits and Systems: Methodologies and Circuit Architectures


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Publisher:   Springer New York
Imprint:   Springer New York
ISBN:  

9781282972568


ISBN 10:   1282972561
Pages:   223
Publication Date:   01 January 2011
Audience:   General/trade ,  General
Format:   Electronic book text
Publisher's Status:   Active
Availability:   In stock   Availability explained
We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately.

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