Reliability of Microtechnology: Interconnects, Devices and Systems

Author:   Johan Liu ,  Olli Salmela ,  Jussi Sarkka ,  James E. Morris
Publisher:   Springer-Verlag New York Inc.
Edition:   2011 ed.
ISBN:  

9781489982117


Pages:   204
Publication Date:   11 October 2014
Format:   Paperback
Availability:   Manufactured on demand   Availability explained
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Reliability of Microtechnology: Interconnects, Devices and Systems


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Overview

Reliability of Microtechnology discusses the reliability of microtechnology products from the bottom up, beginning with devices and extending to systems. The book's focus includes but is not limited to reliability issues of interconnects, the methodology of reliability concepts and general failure mechanisms. Specific failure modes in solder and conductive adhesives are discussed at great length. Coverage of accelerated testing, component and system level reliability, and reliability design for manufacturability are also described in detail. The book also includes exercises and detailed solutions at the end of each chapter.

Full Product Details

Author:   Johan Liu ,  Olli Salmela ,  Jussi Sarkka ,  James E. Morris
Publisher:   Springer-Verlag New York Inc.
Imprint:   Springer-Verlag New York Inc.
Edition:   2011 ed.
Dimensions:   Width: 15.50cm , Height: 1.20cm , Length: 23.50cm
Weight:   0.454kg
ISBN:  

9781489982117


ISBN 10:   1489982116
Pages:   204
Publication Date:   11 October 2014
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

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