Reliability of High Mobility Sige Channel Mosfets for Future CMOS Applications
Publisher:   Springer
ISBN:  

9781306544429


Pages:   203
Publication Date:   01 January 2014
Format:   Undefined
Availability:   In stock   Availability explained
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Reliability of High Mobility Sige Channel Mosfets for Future CMOS Applications


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Publisher:   Springer
Imprint:   Springer
ISBN:  

9781306544429


ISBN 10:   1306544424
Pages:   203
Publication Date:   01 January 2014
Audience:   General/trade ,  General
Format:   Undefined
Publisher's Status:   Active
Availability:   In stock   Availability explained
We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately.

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