Overview

This book focuses on reliability and radiation effects in compound semiconductors, which have evolved rapidly during the last 15 years. It starts with first principles, and shows how advances in device design and manufacturing have suppressed many of the older reliability mechanisms.It is the first book that comprehensively covers reliability and radiation effects in optoelectronic as well as microelectronic devices. It contrasts reliability mechanisms of compound semiconductors with those of silicon-based devices, and shows that the reliability of many compound semiconductors has improved to the level where they can be used for ten years or more with low failure rates.

Full Product Details

Author:   Allan H Johnston (California Inst Of Technology, Usa)
Publisher:   World Scientific Publishing Co Pte Ltd
Imprint:   World Scientific Publishing Co Pte Ltd
Dimensions:   Width: 15.70cm , Height: 2.50cm , Length: 22.90cm
Weight:   0.680kg
ISBN:  

9789814277105

ISBN 10:   981427710
Pages:   376
Publication Date:   28 April 2010
Audience:   College/higher education ,  Professional and scholarly ,  Tertiary & Higher Education ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Out of stock  
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

Table of Contents

Semiconductor Fundamentals; Transistor Technologies; Optoelectronics; Fundamentals of Reliability; Reliability of Compound Semiconductor Electronics; Optoelectronic Device Reliability; Space Radiation; Interaction of Radiation with Semiconductors; Radiation Damage in Compound Semiconductors; Radiation Damage in Optoelectronics; Transient Radiation Effects; Radiation Effects in Optoisolators; Summary and Perspective.

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