Reliability and Radiation Effects in Compound Semiconductors

Author:   Allan H Johnston
Publisher:   World Scientific Publishing Company
ISBN:  

9781283143745


Pages:   376
Publication Date:   01 January 2010
Format:   Electronic book text
Availability:   In stock   Availability explained
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Reliability and Radiation Effects in Compound Semiconductors


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Author:   Allan H Johnston
Publisher:   World Scientific Publishing Company
Imprint:   World Scientific Publishing Company
ISBN:  

9781283143745


ISBN 10:   1283143747
Pages:   376
Publication Date:   01 January 2010
Audience:   General/trade ,  General
Format:   Electronic book text
Publisher's Status:   Active
Availability:   In stock   Availability explained
We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately.

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