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OverviewFull Product DetailsAuthor: Milton Ohring (Stevens Institute of Technology, Hoboken, NJ, USA (Retired)) , Milton Ohring (Stevens Institute of Technology, Hoboken, NJ, USA (Retired)) , Milton Ohring (Stevens Institute of Technology, Hoboken, NJ, USA (Retired)) , Milton Ohring (Stevens Institute of Technology, Hoboken, NJ, USA (Retired))Publisher: Elsevier Science Publishing Co Inc Imprint: Academic Press Inc Dimensions: Width: 15.20cm , Height: 3.70cm , Length: 22.90cm Weight: 1.090kg ISBN: 9780125249850ISBN 10: 0125249853 Pages: 720 Publication Date: 12 June 1998 Audience: Professional and scholarly , Professional & Vocational Replaced By: 9780120885749 Format: Hardback Publisher's Status: Active Availability: Out of print, replaced by POD  We will order this item for you from a manufatured on demand supplier. Table of ContentsReviewsAuthor InformationDr. Milton Ohring, author of two previously acclaimed Academic Press books,The Materials Science of Thin Films (l992) and Engineering Materials Science (1995), has taught courses on reliability and failure in electronics at Bell Laboratories (AT&T and Lucent Technologies). From this perspective and the well-written tutorial style of the book, the reader will gain a deeper physical understanding of failure mechanisms in electronic materials and devices; acquire skills in the mathematical handling of reliability data; and better appreciate future technology trends and the reliability issues they raise. Tab Content 6Author Website:Countries AvailableAll regions |
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