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OverviewIntroduces a theory of random testing in digital circuits for the first time and offers practical guidance for the implementation of random pattern generators, signature analyzers design for random testability, and testing results. Contains several new and unpublished results. Full Product DetailsAuthor: DavidPublisher: Taylor & Francis Inc Imprint: CRC Press Inc Dimensions: Width: 15.20cm , Height: 2.90cm , Length: 22.90cm Weight: 0.861kg ISBN: 9780824701826ISBN 10: 0824701828 Pages: 500 Publication Date: 08 April 1998 Audience: College/higher education , Professional and scholarly , General/trade , Undergraduate , Postgraduate, Research & Scholarly Format: Hardback Publisher's Status: Active Availability: In Print  This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of ContentsReviewsThis book is based on the author's work in the area of random pattern testing. . .It is well based in mathematics, which is very refreshing to read. . .With the analytical tools developed in this book you will be taken through the frontier of random pattern testing from the very fundamentals right up to very useful concepts, which can be applied in today's design to many very useful techniques. ---T.W. Williams, University of Hannover and IBM, Hannover, Germany . . .Rene David presents a broad spectrum of topics on random testing of digital circuits at a level accessible to undergraduate students, and yet challenging for advanced graduate students and engineers working in industry. The book is well written, readable, reliable and accurate. It is a gem. It should be on the shelf (and not only there!) of all professionals dealing with digital testing. ---Test Technology Newsletter of the IEEE Computer Society . . .David's book will be valuable (especially graduate) students because it is clearly written and well structured, and includes recent scientific results. It will also serve as a reference book for experts because it summarizes work that is scattered among the journals and conference proceedings. ---Interfaces """This book is based on the author's work in the area of random pattern testing. . .It is well based in mathematics, which is very refreshing to read. . .With the analytical tools developed in this book you will be taken through the frontier of random pattern testing from the very fundamentals right up to very useful concepts, which can be applied in today's design to many very useful techniques. "" ---T.W. Williams, University of Hannover and IBM, Hannover, Germany "". . .Rene David presents a broad spectrum of topics on random testing of digital circuits at a level accessible to undergraduate students, and yet challenging for advanced graduate students and engineers working in industry. The book is well written, readable, reliable and accurate. It is a gem. It should be on the shelf (and not only there!) of all professionals dealing with digital testing."" ---Test Technology Newsletter of the IEEE Computer Society "". . .David's book will be valuable (especially graduate) students because it is clearly written and well structured, and includes recent scientific results. It will also serve as a reference book for experts because it summarizes work that is scattered among the journals and conference proceedings."" ---Interfaces" Author InformationRene David is a Research Director at the Centre National de la recherche Scientififique working at the Instuit National Polytechnique de Grenoble, France. Tab Content 6Author Website:Countries AvailableAll regions |
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