Process Variations and Probabilistic Integrated Circuit Design

Author:   Manfred Dietrich ,  Joachim Haase
Publisher:   Springer
ISBN:  

9786613443854


Pages:   266
Publication Date:   01 January 2012
Format:   Electronic book text
Availability:   In stock   Availability explained
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Process Variations and Probabilistic Integrated Circuit Design


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Overview

Uncertainty in key parameters within a chip and between different chips in the deep sub micron area plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development.This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits. Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design.

Full Product Details

Author:   Manfred Dietrich ,  Joachim Haase
Publisher:   Springer
Imprint:   Springer
ISBN:  

9786613443854


ISBN 10:   6613443859
Pages:   266
Publication Date:   01 January 2012
Audience:   General/trade ,  General
Format:   Electronic book text
Publisher's Status:   Active
Availability:   In stock   Availability explained
We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately.

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