Process Variations and Probabilistic Integrated Circuit Design

Author:   Manfred Dietrich ,  Joachim Haase
Publisher:   Springer-Verlag New York Inc.
Edition:   2012 ed.
ISBN:  

9781489988607


Pages:   252
Publication Date:   25 January 2014
Format:   Paperback
Availability:   Manufactured on demand   Availability explained
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Process Variations and Probabilistic Integrated Circuit Design


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Overview

Uncertainty in key parameters within a chip and between different chips in the deep sub micron area plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development. This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits. Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design.

Full Product Details

Author:   Manfred Dietrich ,  Joachim Haase
Publisher:   Springer-Verlag New York Inc.
Imprint:   Springer-Verlag New York Inc.
Edition:   2012 ed.
Dimensions:   Width: 15.50cm , Height: 1.40cm , Length: 23.50cm
Weight:   0.415kg
ISBN:  

9781489988607


ISBN 10:   1489988602
Pages:   252
Publication Date:   25 January 2014
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

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