Variation-Aware Advanced CMOS Devices and SRAM

Author:   Changhwan Shin
Publisher:   Springer
Edition:   1st ed. 2016
Volume:   56
ISBN:  

9789401775953


Pages:   140
Publication Date:   16 June 2016
Format:   Hardback
Availability:   Manufactured on demand   Availability explained
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Variation-Aware Advanced CMOS Devices and SRAM


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Author:   Changhwan Shin
Publisher:   Springer
Imprint:   Springer
Edition:   1st ed. 2016
Volume:   56
Dimensions:   Width: 15.50cm , Height: 1.40cm , Length: 23.50cm
Weight:   3.763kg
ISBN:  

9789401775953


ISBN 10:   9401775958
Pages:   140
Publication Date:   16 June 2016
Audience:   College/higher education ,  Professional and scholarly ,  Postgraduate, Research & Scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

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Prof. Changhwan Shin is an Assistant Professor in School of Electrical and Computer Engineering in University of Seoul. Prof. Shin is a graduate of Korea University (BE) and University of California Berkeley (Ph.D). Also, he is Technical Committee Members for IEEE SOI Conference and European Solid-State Device Research Conference (ESSDERC). His research activities cover Electronic Devices and Integrated Circuits; Advanced electronic device architecture for various types of System-on-Chip(SoC) memory and logic devices/ All-in-one Variability Analysis for Nanometer-scale Electronic Devices/ Post-Silicon Technology (CNT, Graphene) & Bio-applications/ Device-and-Circuit Co-optimization: ""Low-Level"" Digital/Analog Circuit Design Methodology Development/ Programmable Chip Development using Advanced Electronic Devices.

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