Overview

Full Product Details

Author:   Samiha Mourad (Santa Clara University) ,  Yervant Zorian (Logic Vision) ,  Y. Zorian
Publisher:   John Wiley & Sons Inc
Imprint:   Wiley-Interscience
Dimensions:   Width: 16.50cm , Height: 2.50cm , Length: 24.00cm
Weight:   0.708kg
ISBN:  

9780471319313

ISBN 10:   0471319317
Pages:   440
Publication Date:   15 August 2000
Audience:   College/higher education ,  Professional and scholarly ,  Undergraduate ,  Postgraduate, Research & Scholarly
Format:   Hardback
Publisher's Status:   Active
Availability:   Out of stock  
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Table of Contents

DESIGN AND TEST. Overview of Testing. Defects, Failures, and Faults. Design Representation. VLSI Design Flow. TEST FLOW. Role of Simulation in Testing. Automatic Test Pattern Generation. Current Testing. DESIGN FOR TESTABILITY. Ad Hoc Test Techniques. Scan-Path Design. Boundary-Scan Testing. Built-in Self-Test. SPECIAL STRUCTURES. Memory Testing. Testing FPGAs and Microprocessors. ADVANCED TOPICS. Synthesis for Testability. Testing SOCs. Appendices. Index.

Reviews

Highly recommended for libraries serving undergraduate and graduate electrical engineering students and professional practitioners. (Choice, Vol. 38, No. 7, March 2001)

Author Information

SAMIHA MOURAD, PhD, is Professor of Electrical Engineering at Santa Clara University, Santa Clara, California. YERVANT ZORIAN, PhD, is Chief Technology Advisor at Logic Vision, Inc., San Jose, California.

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