Principles of Semiconductor Network Testing

Author:   Amir Afshar
Publisher:   Elsevier Science & Technology
ISBN:  

9786611039400


Pages:   350
Publication Date:   05 June 1995
Format:   Electronic book text
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

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Principles of Semiconductor Network Testing


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Overview

This book gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor. This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources. It introduces a novel component-testing philosophy for semiconductor test, product and design engineers. It provides best new source of information for experienced semiconductor engineers as well as entry-level personnel. It includes eight chapters about semiconductor testing.

Full Product Details

Author:   Amir Afshar
Publisher:   Elsevier Science & Technology
Imprint:   Elsevier Science & Technology
ISBN:  

9786611039400


ISBN 10:   6611039406
Pages:   350
Publication Date:   05 June 1995
Audience:   General/trade ,  General
Format:   Electronic book text
Publisher's Status:   Active
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

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