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OverviewThis book gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor. This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources. It introduces a novel component-testing philosophy for semiconductor test, product and design engineers. It provides best new source of information for experienced semiconductor engineers as well as entry-level personnel. It includes eight chapters about semiconductor testing. Full Product DetailsAuthor: Amir AfsharPublisher: Elsevier Science & Technology Imprint: Elsevier Science & Technology ISBN: 9786611039400ISBN 10: 6611039406 Pages: 350 Publication Date: 05 June 1995 Audience: General/trade , General Format: Electronic book text Publisher's Status: Active Availability: Out of stock The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available. Table of ContentsReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |