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OverviewThis book gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor. This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources. Introduces a novel component-testing philosophy for semiconductor test, product and design engineers. Best new source of information for experienced semiconductor engineers as well as entry-level personnel. Eight chapters about semiconductor testing. Full Product DetailsAuthor: Amir AfsharPublisher: Newnes Imprint: Newnes ISBN: 9781281039408ISBN 10: 1281039403 Pages: 213 Publication Date: 01 January 1996 Audience: General/trade , General Format: Electronic book text Publisher's Status: Active Availability: In stock We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately. Table of ContentsReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |