Principles of Semiconductor Network Testing

Author:   Amir Afshar
Publisher:   Newnes
ISBN:  

9781281039408


Pages:   213
Publication Date:   01 January 1996
Format:   Electronic book text
Availability:   In stock   Availability explained
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Principles of Semiconductor Network Testing


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Overview

This book gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor. This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources. Introduces a novel component-testing philosophy for semiconductor test, product and design engineers. Best new source of information for experienced semiconductor engineers as well as entry-level personnel. Eight chapters about semiconductor testing.

Full Product Details

Author:   Amir Afshar
Publisher:   Newnes
Imprint:   Newnes
ISBN:  

9781281039408


ISBN 10:   1281039403
Pages:   213
Publication Date:   01 January 1996
Audience:   General/trade ,  General
Format:   Electronic book text
Publisher's Status:   Active
Availability:   In stock   Availability explained
We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately.

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