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OverviewThe fourth edition of this book has been widely revised. It includes additional chapters and some sections are complemented with either new ones or an extension of their content.In this latest edition a complete treatment of the physics and properties of semiconductors is presented, covering transport phenomena in semiconductors, scattering mechanisms, radiation effects and displacement damages. Furthermore, this edition presents a comprehensive treatment of the Coulomb scattering on screened nuclear potentials resulting from electrons, protons, light- and heavy-ions - ranging from (very) low up to ultra-relativistic kinetic energies - and allowing one to derive the corresponding NIEL (non-ionizing energy-loss) doses deposited in any material.The contents are organized into two parts: Chapters 1 to 7 cover Particle Interactions and Displacement Damage while the remaining chapters focus on Radiation Environments and Particle Detection.This book can serve as reference for graduate students and final-year undergraduates and also as supplement for courses in particle, astroparticle, space physics and instrumentation. A section of the book is directed toward courses in medical physics. Researchers in experimental particle physics at low, medium, and high energy who are dealing with instrumentation will also find the book useful. Full Product DetailsAuthor: Pier-giorgio Rancoita (Infn Milano & Univ Degli Studi Di Milano-bicocca, Italy) , Claude Leroy (Univ De Montreal, Canada)Publisher: World Scientific Publishing Co Pte Ltd Imprint: World Scientific Publishing Co Pte Ltd Edition: 4th Revised edition ISBN: 9789814603188ISBN 10: 981460318 Pages: 1344 Publication Date: 24 February 2016 Audience: College/higher education , Professional and scholarly , Tertiary & Higher Education , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: In Print This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of ContentsReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |