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OverviewMinimization of power dissipation in very large scale integrated (VLSI) circuits is important to improve reliability and reduce packaging costs. While many techniques have investigated power minimization during the functional (normal) mode of operation, it is important to examine the power dissipation during the test circuit activity is substantially higher during test than during functional operation. For example, during the execution of built-in self-test (BIST) in-field sessions, excessive power dissipation can decrease the reliability of the circuit under test due to higher temperature and current density. Power-Constrained Testing of VLSI Circuits focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. The first part of this book surveys the existing techniques for power constrained testing of VLSI circuits. In the second part, several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths are presented. Full Product DetailsAuthor: Nicola Nicolici , Bashir M. Al-HashimiPublisher: Springer-Verlag New York Inc. Imprint: Springer-Verlag New York Inc. Edition: Softcover reprint of the original 1st ed. 2003 Volume: 22B Dimensions: Width: 15.50cm , Height: 1.00cm , Length: 23.50cm Weight: 0.454kg ISBN: 9781441953155ISBN 10: 1441953159 Pages: 178 Publication Date: 09 December 2010 Audience: Professional and scholarly , Professional & Vocational Format: Paperback Publisher's Status: Active Availability: Out of stock  The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available. Table of ContentsDesign and Test of Digital Integrated Circuits.- Power Dissipation During Test.- Approaches to Handle Test Power.- Power Minimization Based on Best Primary Input Change Time.- Test Power Minimization Using Multiple Scan Chains.- Power-conscious Test Synthesis and Scheduling.- Power Profile Manipulation.- Conclusion.ReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |
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