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OverviewManaging the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices. Full Product DetailsAuthor: Patrick Girard , Nicola Nicolici , Xiaoqing WenPublisher: Springer-Verlag New York Inc. Imprint: Springer-Verlag New York Inc. Edition: 2010 ed. Dimensions: Width: 15.50cm , Height: 2.00cm , Length: 23.50cm Weight: 0.593kg ISBN: 9781489983138ISBN 10: 1489983139 Pages: 363 Publication Date: 05 September 2014 Audience: Professional and scholarly , Professional & Vocational Format: Paperback Publisher's Status: Active Availability: Manufactured on demand  We will order this item for you from a manufactured on demand supplier. Table of ContentsReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |
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