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OverviewThis volume provides a timely description of the latest compact MOS transistor models for circuit simulation. The first generation BSIM3 and BSIM4 models that have dominated circuit simulation in the last decade are no longer capable of characterizing all the important features of modern sub-100nm MOS transistors. This book discusses the second generation MOS transistor models that are now in urgent demand and being brought into the initial phase of manufacturing applications. It considers how the models are to include the complete drift-diffusion theory using the surface potential variable in the MOS transistor channel in order to give one characterization equation. Full Product DetailsAuthor: Tatsuya Ezaki (Hiroshima Univ, Japan) , Hans Jurgen Mattausch (Hiroshima Univ, Japan) , Mitiko Miura-mattausch (Hiroshima Univ, Japan)Publisher: World Scientific Publishing Co Pte Ltd Imprint: World Scientific Publishing Co Pte Ltd Volume: 0 Dimensions: Width: 15.20cm , Height: 2.00cm , Length: 22.90cm Weight: 0.508kg ISBN: 9789813203310ISBN 10: 9813203315 Pages: 380 Publication Date: 05 June 2008 Audience: College/higher education , Professional and scholarly , Postgraduate, Research & Scholarly , Professional & Vocational Format: Paperback Publisher's Status: Active Availability: In Print This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of ContentsReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |